జర్నల్ ఆఫ్ మెటీరియల్ సైన్సెస్ & ఇంజనీరింగ్

Dielectric Properties and Crystal Structure of (Mg_0.95Ni_0.05)₄(Nb_1-Xta_x)₂O₉ Ceramics

Abstract

Bing-Jing Li, Sih-Yin Wang and Yuan-Bin Chen

The microstructure of (Mg0.95Ni0.05)4(Nb1-xTax)2O9 is analyzed using X-ray diffractometry and scanning electron microscopy. The Qxf values of (Mg0.95Ni0.05)4(Nb1-xTax)2O9 increases with increasing sintering temperature; and then up to a temperature of 1375°C significantly decreased. The maximum values of the electric permititivity and the quality factor (Qxf) can be obtained 12.76 and 442,000 GHz is obtained for (Mg0.95Ni0.05)4(Nb1-xTax)2O9 sintered at 1375°C for 4 h. The temperature coefficient of resonant frequency (τf) measured for (Mg0.95Ni0.05)4(Nb1-xTax)2O9 is −54 ppm/°C.